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G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface through the oxide layers
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface through the oxide layers
$115.50
Description
through the oxide layers
Floating Zone (FZ) method for single crystal silicon wafers
as technology advances to smaller and smaller dimensions for the elements of high density integrated circuits
This Standard was technically approved by the Flat Panel Display – Color Global Technical Committee
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface through the oxide layersglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
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