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G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法（提案） Revision:SEMI G52-90 (Reapproved 1104) - Superseded SEMI MF154-1105 (technical revision)
G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法（提案） Revision:SEMI G52-90 (Reapproved 1104) - Superseded SEMI MF154-1105 (technical revision)
$115.50
Description
SEMI MF154-1105 (technical revision)
The maintenance of a control chart to monitor the long-term stability of the measurement process is required
all documents cited shall be the latest published versions
The glass substrate is intended to remain permanently in the package or device
G05200 - SEMI G52 - 半導体リードフレームのイオン汚染物の測定のための標準測定法（提案） Revision:SEMI G52-90 (Reapproved 1104) - Superseded SEMI MF154-1105 (technical revision)Global Assembly and Packaging CommitteeJapanese Packaging Committee2004723Japanese Regional Standards Committee20049www. semi. org2004111990 Na+NH4+K+Cl NO3 Br SO42 PO43 Referenced SEMI Standards None.
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