Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials Ingestion-build-84997

Semiconductor devices. Micro-electromechanical devices - Test method for Poisson's ratio of thin film MEMS materials Ingestion-build-849971 Scope This part of IEC 62047 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin film micro electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 m.

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BS 5721 defines a weighting characteristic which is designated D for the above-mentioned purpose

BS EN 2591-6314 guides you on the preparation of specimens and provides test methods for checking the sealing of optical connection elements and fibre optic couplers

reducing friction between the spinning shafts and stationary supporting elements

5 Quality conformance inspection

— selecting and specifying security functional requirements (SFRs) from ISO/IEC 15408-2 to protect Personally Identifiable Information (PII)

commissioning and maintenance of systems in non-domestic premises

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Acoustically-actuated systems

Changes have been made to the values in some Tables

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